JG

Jeff Gelb

Sigray (United States) US

141
Publications
3,623
Citations
33
H-Index
49
i10-Index
0
2yr Mean Cite
-
Cite/Paper
Data combined from OpenAlex + Semantic Scholar. OA = OpenAlex S2 = Semantic Scholar
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Research Topics

Electron and X-Ray Spectroscopy Techniques (44) Advanced X-ray Imaging Techniques (32) Advanced Electron Microscopy Techniques and Applications (19) Advancements in Battery Materials (16) Advanced X-ray and CT Imaging (16)

Affiliations

University of Science and Technology of China
CN 2011 - 2008
Argonne National Laboratory
US 2009 - 2009
Carl Zeiss (Germany)
DE 2017 - 2016
FX Palo Alto Laboratory
US 2012 - 2012
SLAC National Accelerator Laboratory
US 2009 - 2009

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