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HA

Hans Arwin

Linköping University SE

0000-0001-9229-2028

366

Publications

8,177

Citations

47

H-Index

152

i10-Index

0.1

2yr Mean Cite

-

Cite/Paper

Data combined from OpenAlex . OA = OpenAlex S2 = Semantic Scholar

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Publication & Citation Trends

Most Cited Works

Infrared dielectric functions and phonon modes of high-quality ZnO films

N. Ashkenov, Beri N. Mbenkum, Carsten Bundesmann, V. Riede, Michael Lorenz +10 more

Journal of Applied Physics 2002

626

Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry

T. W. H. Oates, Herbert Wormeester, Hans Arwin

Progress in Surface Science 2011

215

Total internal reflection ellipsometry: principles and applications

Hans Arwin, Michal Poksinski, Knut Johansen

Applied Optics 2004

207

A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering

Shaobin Guo, Hans Arwin, Sissel N. Jacobsen, Kenneth Järrendahl, Ulf Helmersson

Journal of Applied Physics 1995

205

Increased electromechanical coupling in w−ScxAl1−xN OA

Gunilla Wingqvist, Ferenc Tasnádi, Agnė Žukauskaitė, Jens Birch, Hans Arwin +1 more

Applied Physics Letters 2010

201

Publications

365 total

Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry

T. W. H. Oates, Herbert Wormeester, Hans Arwin - Progress in Surface Science, 2011

Cited by 215 OpenAlex

Increased electromechanical coupling in w−ScxAl1−xN PDF

Gunilla Wingqvist, Ferenc Tasnádi, Agnė Žukauskaitė, Jens Birch, Hans Arwin et al. - Applied Physics Letters, 2010

Cited by 201 OpenAlex

Optical optimization of polyfluorene-fullerene blend photodiodes

Nils-Krister Persson, Hans Arwin, Olle Inganäs - Journal of Applied Physics, 2005

Cited by 116 OpenAlex

Total internal reflection ellipsometry: principles and applications

Hans Arwin, Michal Poksinski, Knut Johansen - Applied Optics, 2004

Cited by 207 OpenAlex

Optical properties of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">MgH</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>measured<i>in situ</i>by ellipsometry and spectrophotometry PDF

J. Isidorsson, I. A. M. E. Giebels, Hans Arwin, R. Griessen - Physical review. B, Condensed matter, 2003

Cited by 155 OpenAlex

Infrared dielectric functions and phonon modes of high-quality ZnO films

N. Ashkenov, Beri N. Mbenkum, Carsten Bundesmann, V. Riede, Michael Lorenz et al. - Journal of Applied Physics, 2002

Cited by 626 OpenAlex

Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations

Knut Johansen, Hans Arwin, Ingemar Lundström, Bo Liedberg - Review of Scientific Instruments, 2000

Cited by 176 OpenAlex

Ellipsometry on thin organic layers of biological interest: characterization and applications

Hans Arwin - Thin Solid Films, 2000

Cited by 135 OpenAlex

Spectroscopic ellipsometry studies of the optical properties of doped poly(3,4-ethylenedioxythiophene): an anisotropic metal

Leif A. A. Pettersson, Fredrik Carlsson, Olle Inganäs, Hans Arwin - Thin Solid Films, 1998

Cited by 155 OpenAlex

Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates

Gang Jin, R. Jansson, Hans Arwin - Review of Scientific Instruments, 1996

Cited by 195 OpenAlex

Research Topics

Optical Polarization and Ellipsometry (55) Silicon Nanostructures and Photoluminescence (38) Liquid Crystal Research Advancements (24) Neurobiology and Insect Physiology Research (23) Analytical Chemistry and Sensors (23)

Frequent Co-Authors

KN

Knut Johansen

2 joint publications

GA

Gang Jin

2 joint publications

IN

Ingemar Lundström

2 joint publications

OL

Olle Inganäs

2 joint publications

N.

N. Ashkenov

1 joint publication

BE

Beri N. Mbenkum

1 joint publication

Affiliations

Linköping University

SE 2026 - 1980

AT&T (United States)

US 1984 - 1984

Lund University

SE 2002 - 2002

Luleå University of Technology

SE 1998 - 1998

Konkuk University

KR 2010 - 2010

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