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JB

Jeffrey D. Black

Sandia National Laboratories California US

ORCID iD 0000-0003-3058-7992
66
Publications
1,998
Citations
18
H-Index
27
i10-Index
0
2yr Mean Cite
-
Cite/Paper
Data combined from OpenAlex . OA = OpenAlex S2 = Semantic Scholar
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Publication & Citation Trends

Publications

66 total

Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization PDF

Dolores Black, William H. Robinson, Ian Wilcox, Daniel B. Limbrick, Jeffrey D. Black - IEEE Transactions on Nuclear Science, 2015
Cited by 139 OpenAlex

The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate PDF

Nathaniel A. Dodds, M.J. Martinez, P.E. Dodd, M.R. Shaneyfelt, F.W. Sexton et al. - IEEE Transactions on Nuclear Science, 2015
Cited by 84 OpenAlex

Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction

Jeffrey D. Black, P.E. Dodd, Kevin M. Warren - IEEE Transactions on Nuclear Science, 2013
Cited by 177 OpenAlex

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed, Ronald D. Schrimpf, Kevin M. Warren et al. - IEEE Transactions on Nuclear Science, 2009
Cited by 192 OpenAlex

Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

Oluwole A. Amusan, L. W. Massengill, M.P. Baze, Andrew L. Sternberg, A.F. Witulski et al. - IEEE Transactions on Device and Materials Reliability, 2008
Cited by 109 OpenAlex

Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

Jeffrey D. Black, Dennis R. Ball, William H. Robinson, Daniel M. Fleetwood, Ronald D. Schrimpf et al. - IEEE Transactions on Nuclear Science, 2008
Cited by 83 OpenAlex

Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes

Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf, L. W. Massengill, Matthew J. Gadlage et al. - IEEE Transactions on Nuclear Science, 2008
Cited by 70 OpenAlex

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf, L. W. Massengill, Matthew J. Gadlage et al. - IEEE Transactions on Nuclear Science, 2007
Cited by 170 OpenAlex

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill, B. L. Bhuva, Patrick R. Fleming et al. - IEEE Transactions on Nuclear Science, 2006
Cited by 395 OpenAlex

HBD layout isolation techniques for multiple node charge collection mitigation

Jeffrey D. Black, Andrew L. Sternberg, Michael L. Alles, Arthur F. Witulski, B. L. Bhuva et al. - IEEE Transactions on Nuclear Science, 2005
Cited by 122 OpenAlex

Research Topics

Radiation Effects in Electronics (47) Semiconductor materials and devices (21) VLSI and Analog Circuit Testing (20) Integrated Circuits and Semiconductor Failure Analysis (20) Low-power high-performance VLSI design (7)

Affiliations

Portland State University
US 2021 - 2021
RTX (United States)
US 2002 - 2002
Sandia National Laboratories California
US 2025 - 2013
Vanderbilt University
US 2011 - 2005
Wisconsin Department of Natural Resources
US 1944 - 1944

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