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PD

P.E. Dodd

Los Angeles Valley College US

214

Publications

9,671

Citations

50

H-Index

107

i10-Index

0

2yr Mean Cite

-

Cite/Paper

Data combined from OpenAlex . OA = OpenAlex S2 = Semantic Scholar

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Publication & Citation Trends

Most Cited Works

Basic mechanisms and modeling of single-event upset in digital microelectronics

P.E. Dodd, L. W. Massengill

IEEE Transactions on Nuclear Science 2003

1,112

Radiation Effects in MOS Oxides

James R. Schwank, M.R. Shaneyfelt, Daniel M. Fleetwood, James A. Felix, P.E. Dodd +2 more

IEEE Transactions on Nuclear Science 2008

910

Radiation effects in SOI technologies

J.R. Schwank, V. Ferlet-Cavrois, M.R. Shaneyfelt, Philippe Paillet, P.E. Dodd

IEEE Transactions on Nuclear Science 2003

431

Current and Future Challenges in Radiation Effects on CMOS Electronics

P.E. Dodd, M.R. Shaneyfelt, J.R. Schwank, J. Félix

IEEE Transactions on Nuclear Science 2010

358

Production and propagation of single-event transients in high-speed digital logic ICs

P.E. Dodd, M.R. Shaneyfelt, J. Félix, J.R. Schwank

IEEE Transactions on Nuclear Science 2004

329

Publications

214 total

Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance PDF

J.R. Schwank, M.R. Shaneyfelt, P.E. Dodd - IEEE Transactions on Nuclear Science, 2013

Cited by 190 OpenAlex

Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction

Jeffrey D. Black, P.E. Dodd, Kevin M. Warren - IEEE Transactions on Nuclear Science, 2013

Cited by 177 OpenAlex

Current and Future Challenges in Radiation Effects on CMOS Electronics

P.E. Dodd, M.R. Shaneyfelt, J.R. Schwank, J. Félix - IEEE Transactions on Nuclear Science, 2010

Cited by 358 OpenAlex

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Jonathan A. Pellish, Kenneth P. Rodbell, Kenneth A. LaBel et al. - IEEE Transactions on Nuclear Science, 2009

Cited by 162 OpenAlex

Radiation Effects in MOS Oxides

James R. Schwank, M.R. Shaneyfelt, Daniel M. Fleetwood, James A. Felix, P.E. Dodd et al. - IEEE Transactions on Nuclear Science, 2008

Cited by 910 OpenAlex

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Kenneth A. LaBel, James R. Schwank, Kenneth P. Rodbell et al. - IEEE Transactions on Nuclear Science, 2008

Cited by 157 OpenAlex

New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

V. Ferlet-Cavrois, Philippe Paillet, Dale McMorrow, N. Fel, J. Baggio et al. - IEEE Transactions on Nuclear Science, 2007

Cited by 151 OpenAlex

Physics-based simulation of single-event effects

P.E. Dodd - IEEE Transactions on Device and Materials Reliability, 2005

Cited by 150 OpenAlex

Production and propagation of single-event transients in high-speed digital logic ICs

P.E. Dodd, M.R. Shaneyfelt, J. Félix, J.R. Schwank - IEEE Transactions on Nuclear Science, 2004

Cited by 329 OpenAlex

Basic mechanisms and modeling of single-event upset in digital microelectronics

P.E. Dodd, L. W. Massengill - IEEE Transactions on Nuclear Science, 2003

Cited by 1,112 OpenAlex

Research Topics

Radiation Effects in Electronics (124) Semiconductor materials and devices (113) Integrated Circuits and Semiconductor Failure Analysis (97) Advancements in Semiconductor Devices and Circuit Design (56) VLSI and Analog Circuit Testing (26)

Frequent Co-Authors

M.

M.R. Shaneyfelt

9 joint publications

J.

J.R. Schwank

6 joint publications

JA

James R. Schwank

3 joint publications

PH

Philippe Paillet

3 joint publications

J.

J. Félix

3 joint publications

V.

V. Ferlet-Cavrois

2 joint publications

Affiliations

Birmingham City University

GB 2015 - 2015

United States Naval Research Laboratory

US 2010 - 2010

Oak Ridge National Laboratory

US 2000 - 2000

United States Department of Commerce

US 2000 - 2000

University of Arizona

US 1996 - 1996

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